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Current Cool Picture
 
X-ray Bright-Field Imaging
Intoduction
Can x rays yield bright-field images of crystalline systems similar to those of transmission electron microscopy? So far, the response was negative, but we present here a positive case: bright-field x-ray images carrying information both from diffraction/scattering phenomena and from absorption and phase contrast. Specifically, synchrotron x-ray transmission micrographs simultaneously yielded diffraction-based information on strain effects and information on structural inhomogeneities when (0001) 4H-SiC wafers were set for a strong reflection in the Laue geometry. This approach offers interesting advantages with respect to the separate study of strain and inhomogeneity effects for a variety of crystalline systems.
Some pictures of our experiments

X-ray Bright-Field Imaging
Inset: Experimental setup.  Schematic illustration of contrast inversion between transmitted Bright-Field and diffracted Dark-Field beams.
Left Bright-Field image; the inset is the Laue pattern showing the 112¯0 reflection. 
Right  Dark-Field image.
 
 
Pohang University of Science & Techology San 31, Hyojadong, Pohang 790-784, Republic of Korea   
 
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